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High Energy/Let radiation EEE Parts certification Handbook

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NASA Standard
Document Identifiers
Document Number
JSC-HDBK-07-001
Version
Baseline
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0
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NASA Organization and Technical Discipline
Responsible NASA Organization
JSC - Johnson Space Center
Endorsed Standard
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No
NASA Endorsed Standard Status
Not NASA Endorsed
Mandatory Standard
NASA Mandatory Standard
Not a NASA Mandatory Standard
Document Scope
Document Scope
Certifying electronic components is a very involved process. It includes pre-coordination with the radiation test facility for time, schedule and cost, as well as intimate work with designers to develop test procedures and hardware. It also involves work with radiation engineers to understand the effects of the radiation field on the test article/setup as well as the analysis and production of a test report. The technical content of traditional ionizing radiation testing protocol is in wide use and generally follows established standards (ref. Appendix C). This document is not intended to cover all these areas but to cover the methodology of using Variable Depth Bragg Peak (VDBP) to accomplish the goal of characterizing an electronic component. The Variable Depth Bragg Peak (VDBP) test method is primarily used for deep space applications of electronics. However, it can be used on any part for any radiation environment, especially those parts where the sensitive volume cannot be reached by the radiation beam. An example of this problem would be issues that arise in de-lidding of parts or in parts with flip-chip designs, etc. The VDBP method is ideally suited to test modern avionics designs which increasingly incorporate commercial off-the-shelf (COTS) parts and units. Johnson Space Center (JSC) developed software provides assistance to users in developing the radiation characterization data from the raw test data.
Keywords
High Energy/Let (Linear Energy Transfer) radiation, EEE parts certification, VDBP (Variable Depth Bragg Peak),deep space environments, galactic cosmic ray (GCR)
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